Deep Learning for Computer Aided Cancer Detection and Diagnosis with Medical Imaging
in Special Issue Posted on August 13, 2017Information for the Special Issue
Submission Deadline: | Mon 15 Jan 2018 |
Journal Impact Factor : | 7.196 |
Journal Name : | Pattern Recognition |
Journal Publisher: |
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Website for the Special Issue: | https://www.journals.elsevier.com/pattern-recognition/call-for-papers/special-issue-on-deep-learning-for-computer-aided-cancer-det |
Journal & Submission Website: | https://www.journals.elsevier.com/pattern-recognition |
Special Issue Call for Papers:
Special Issue on Deep Learning for Computer Aided Cancer Detection and Diagnosis with Medical Imaging
Computer aided cancer detection and diagnosis (CAD) has made significant strides in the past 10 years, with the result that many successful CAD systems have been developed. However, the accuracy of these systems still requires significant improvement, so that the can meet the needs of real world diagnostic situations.. Recent progress in machine learning offers new prospects for computer aided cancer detection and diagnosis. A major recent development is the massive success resulting from the use of deep learning techniques, which has attracted attention from both the academic research and commercial application communities. Deep learning is the fastest-growing field in machine learning and is widespread uses in cancer detection and diagnosis. Recent research has demonstrated that deep learning can increase cancer detection accuracy significantly. Thus, deep learning techniques offer the promise not only of more accurate CAD systems for cancer detection and diagnosis, but may also revolutionize their design.
This special issue seeks high-quality original research papers on cancer detection and diagnosis in medical imaging and image processing. The topics of interest include, but are not limited to:
- Deep learning for cancer tissue classification
- Deep learning for cancer image segmentation
- Deep learning for cancer location
- Deep learning for cancer image retrieval
- Deep learning for high accuracy computer-aided detection/diagnosis systems
- Deep learning architecture for big cancer data
- GPU implementation of deep learning techniques for cancer detection/ diagnosis
- Real-time deep learning techniques for cancer detection/diagnosis
- Learning from multiple modalities of imaging data for cancer detection/diagnosis
- Deep learning for big image data analysis and its applications to cancer detection/diagnosis
We are especially welcome the papers describing new deep learning algorithms and papers which advance pattern recognition methodology. The selection of the papers will be based on their scientific quality, their contribution to the field of pattern recognition, and their relevance to cancer detection and diagnosis.
All papers will undergo the journal’s usual review process and will be reviewed by at least three referees. Please refer to the website http://www.journals.elsevier.com/pattern-recognition/ for detailed instructions on paper submission. Papers should be formatted in a single column, with double spacing and numbered pages, and be between 20 and 35 pages in length.
Submission deadlines
Manuscript submissions due: August 15, 2017
First review completed: Oct. 15, 2017
Revised manuscripts due: Nov. 15, 2017
Second review completed: Dec. 15, 2017
Final manuscript due: Jan. 15, 2018
Targeted issue of Pattern Recognition: March. 2018
Guest Editors
Jinshan Tang, Michigan Technological University, USA. E-mail: jinshant@mtu.edu
Yongyi Yang, Illinois Institute of Technology, USA. E-mail: yangyo@iit.edu
Jianhua Yao, National Institute of Health, USA. E-mail: jyao@cc.nih.gov
SoS Agiagn, University of Texas at San Antonio, USA. E-mail: Sos.Agaian@utsa.edu
Lin Yang, University of Florida, USA. E-mail: lin.yang@bme.ufl.edu
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