Microelectronics Reliability

in Journal   Posted on November 4, 2020 

Journal Ranking & Metrics

Impact Score : 1.49
G2R H-Index : 5
JCR Impact Factor : 1.535
Scopus Citescore : 3.1
SCIMAGO H-index : 87
Guide2Research Overall Ranking : 498

Journal Information

ISSN : 0026-2714
Publisher :
Editors-in-Chief : Dr. M. Tahoori
Journal & Submission Website : https://www.journals.elsevier.com/microelectronics-reliability

Top Scientists who published in this Journal

Number of top scientists* : 8
Documents published by top scientists* : 16
* Based on data published during the last three years.

Aims & Scope of the Journal

Microelectronics Reliability publishes original research articles in the areas of Hardware, Robotics & Electronics. The journal is directed at scholars, practitioners and researchers who are involved in such areas of scientific research . Microelectronics Reliability features novel academic papers which undergo peer review by experts in the given subject area. The journal welcomes submissions from the research community where the priority will be on the innovativeness and the practical significance of the reported work.

Microelectronics Reliability is listed at Guide2Research, Web of Science and Scopus. There are a number of leading scholars who contributed to this journal including Michael G. Pecht, Kaushik Roy, Philip HW Leong and HM Sun

For more information on the rules and submission requirements for authors, you are advised to consult the official website for the journal for Microelectronics Reliability at https://www.journals.elsevier.com/microelectronics-reliability .

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