IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing

  in Journal   Posted on November 4, 2020

Journal Ranking & Metrics

Impact Score : 5.78
G2R H-Index : 21
JCR Impact Factor : 3.827
Scopus Citescore : 7.3
SCIMAGO SJR : 1.48
SCIMAGO H-index : 73
Guide2Research Overall Ranking : 144

Journal Information

ISSN : 1939-1404
Publisher :
Periodicity : Monthly
Journal & Submission Website : https://ieeexplore.ieee.org/xpl/aboutJournal.jsp?punumber=4609443

Top Scientists who published in this Journal

Number of top scientists* : 48
Documents published by top scientists* : 121
* Based on data published during the last three years.

Aims & Scope of the Journal

IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing publishes original research documents in the areas of Image Processing & Computer Vision. The journal is targeted at scholars, practitioners and scientists who are involved in such areas of academic research . IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing publishes high-quality, original documents where all submitted articles are peer reviewed to ensure the highest quality. The journal encourages submissions from the research community where emphasis will be placed on the originality and the practical significance of the published work.

IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing is covered by many abstracting/indexing services including Scopus, Journal Citation Reports ( Clarivate ) and Guide2Research. Many renowned scholars considered this journal to publish their scholarly documents including Licheng Jiao, Lorenzo Bruzzone, Antonio J. Plaza and Jonathan Li.

For additional information on the instructions and submission prerequisites for authors, you are advised to see the official website for the journal for IEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing at https://ieeexplore.ieee.org/xpl/aboutJournal.jsp?punumber=4609443 .