WF-IoT 2021 : IEEE World Forum on Internet of Things
in Conferences Posted on October 30, 2020Conference Information
Submission Deadline | Friday 15 Jan 2021 |
Proceedings indexed by : ![]() |
Conference Dates | Jun 20, 2021 - Jun 24, 2021 | |
Conference Address |
New Orleans, United States ![]() |
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Conference & Submission Link | https://wfiot2021.iot.ieee.org/ |

Conference Ranking & Metrics (This is a TOP Conference)
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Proceedings | https://ieeexplore.ieee.org/xpl/conhome/1803621/all-proceedings |
Conference Call for Papers
The IEEE World Forum on the Internet of Things (WFIoT2021) seeks submissions and proposals for original technical papers that address the Internet of Things (IoT), its theoretical and technological building blocks, the applications that drive the growth and evolution of IoT, operational considerations, experimentation, experiences from deployments, and the impacts of IoT on consumers, the public sector, and industrial verticals. The theme for the World Forum is “The Impact of Artificial Intelligence on IoT”. In recognition of the rapid growth of IoT across the world and adoption across almost all verticals we encourage the submission of multi-disciplinary content. Papers should address, but are not limited to, the high-level topics below and the more detailed list found further in this document and on the WFIoT2021 website and can be downloaded as a PDF document:
Applications, Processes, and Services
Artificial Intelligence, Machine Learning, and Analytics
Basic and Enabling Technologies
Communication, Connectivity, and Networking
Computing – from Edge to Cloud
Cybersecurity, Security, and Privacy
Infrastructure, Devices, and Components
Information Processing from Multimedia and Heterogenous Sources
Results from Experiments, Demonstrations and Trials, and Deployment Experiences
Social and Societal Impacts
Systems Engineering, Integration Methods, and Operation Technologies
Theoretical foundations, design methods, and architectural considerations
Conference content will be submitted for inclusion into IEEE Xplore as well as other Abstracting and Indexing (A&I) databases.
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