ATS 2021 : IEEE Asian Test Symposium

in Conferences   Posted on March 17, 2021 

Conference Information

Submission Deadline Sunday 23 May 2021 Proceedings indexed by :
Conference Dates Nov 22, 2021 - Nov 25, 2021
Conference Address Matsuyama, Japan
Conference & Submission Link https://www.ats2021.info.hiroshima-cu.ac.jp/
Conference Organizers : ( Deadline extended ? Click here to edit )

Conference Ranking & Metrics (This is a TOP Conference)

Impact Score 1.16
#Contributing Top Scientists 9
#Papers published by Top Scientists 17
Google Scholar H5-index 11
Guide2Research Overall Ranking: 798
Category Rankings
Hardware, Robotics & Electronics 164
Software Engineering & Programming 191
Proceedings https://ieeexplore.ieee.org/xpl/conhome/1000754/all-proceedings

Conference Call for Papers

Topics of interest include (but are not limited to):

Analog/Mixed-Signal Test
Automatic Test Generation
Board Test and Diagnosis
Boundary Scan Test
Built-In Self-Test (BIST)
Connectivity Testing
Defect-Based Test
Delay and Performance Test
Dependability and Functional Safety
Design for Test (DFT)
Diagnosis and Silicon Debug
Economic of Test
Failure Analysis
Fault Modeling and Simulation
Fault Tolerance
GPU Test
Hardware-Oriented Security and trust
High-Speed I/O Test
Low-Power IC Test
Machine Learning in Test
Memory Test and Repair
Multi-/Many-core Processor Test
Online Test
Power/Thermal/Reliability Issues in Test
Reconfigurable System Test
RF Test
Self-Repair
SiP, Stacked, 3D IC Test
Standards in Test
Test Compression
Test for Biomedical Circuits and Systems
Test for MEMS and Microfluidic Systems
Test for Nanoscale Devices and Emerging Technologies
Test for Reversible and Quantum Circuits
Test for Sensors and IoT
Test Quality
Test Synthesis
Validation and Verification
Yield Analysis and Enhancement

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