IEEE Design & Test

  in Journal   Posted on August 27, 2017

Journal Ranking & Metrics

JCR Impact Factor: 1.366
SJR : 0.28
Scopus H-index : 67
Guide2Research Overall Ranking: 416

Journal Information

ISSN: 2168-2356
Publisher :
Periodicity : Bimonthly
Journal & Submission Website: http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6221038

Aims & Scope of the Journal

IEEE Design & Test offers original works describing the models, methods and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy efficient design, electronic design automation tools, practical technology, and standards.

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