QRS 2020 : The 20th IEEE International Conference on Software Quality, Reliability, and Security

  in Conferences   Posted on February 28, 2020

Conference Information

Submission Deadline Sunday 15 Mar 2020 Proceedings indexed by :
Conference Dates Jul 27, 2020 - Jul 31, 2020
Conference Address Vilnius, Lithuania
Conference & Submission Link https://qrs20.techconf.org/
Conference Organizers : ( Deadline extended ? Click here to edit )

Conference Ranking & Metrics (This is a TOP Conference)

Impact Score 2.31
#Contributing Top Scientists 21
#Papers published by Top Scientists 30
Google Scholar H5-index 8
Guide2Research Overall Ranking: 398
Category Rankings
Computer Security and Cryptography 35
Databases & Information Systems 72
Software Engineering & Programming 91
Proceedings https://ieeexplore.ieee.org/xpl/conhome/1809466/all-proceedings

Conference Call for Papers

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The 20th IEEE International Conference on Software Quality, Reliability, and Security (QRS 2020 )

http://qrs.techconf.org

July 27-31 – Vilnius, Lithuania

(QRS is now a CORE \’B\’ conference! More info: http://portal.core.edu.au/conf-ranks/1185/)

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IMPORTANT DATES

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Mar 08, 2020 Abstracts (Regular & Short)

Mar 15, 2020 Regular & Short Papers

May 01, 2020 Workshop Papers

May 01, 2020 Fast Abstract

May 01, 2020 Industry Track

Jun 10, 2020 Posters

Jun 19, 2020 Camera-ready & author registration

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Special Issue of IEEE Transactions on Reliability

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Selected papers of high quality will be published in a special

section of IEEE Transactions on Reliability instead of the

conference proceedings. This will speed up the journal

publication of these papers.

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Best Paper Award

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At least one Best Paper Award with a cash prize will be presented.

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IEEE International Software Testing Contest

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The 4th IEEE International Software Testing Contest will also

be held in conjunction with QRS 2020 on July 28.

More details at https://qrs20.techconf.org/track/contest

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TOPICS OF INTEREST

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Topics of interest include, but are not limited to the

following subjects:

* Reliability, Security, Availability, and Safety

of Software Systems

* Software Testing, Verification, and Validation

* Program Debugging and Comprehension

* Information and Software Quality Assurance

* Fault Tolerance for Software Reliability Improvement

* Modeling, Prediction, Simulation, and Evaluation

* Metrics, Measurements, and Analysis

* Secure and Reliable Storage

* Software Penetration and Protection

* Software Vulnerabilities

* Formal Methods

* Malware Detection and Analysis

* Intrusion Detection and Prevention

* Operating System Security and Reliability

* Mobile and Smartphone Applications

* Internet of Things and Cloud Computing

* Information and Knowledge Management

* Benchmark, Tools, Industrial Applications,

and Empirical Studies

* Machine Learning and Deep Learning Models and Systems

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SUBMISSION

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Submit original manuscripts (not published or considered

elsewhere) with a maximum of twelve pages (regular papers),

eight pages (short papers and workshop papers), and two pages

(Fast Abstract Track, Industry Track, and Posters).

Each paper should include a title and the name and affiliation

of each author. Except for the Fast Abstract Track, Industry

Track, and Posters, each submission should also include

a 150-word abstract and up to 6 keywords. The format of your

submission must follow the guidelines for IEEE

conference proceedings.

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CONFERENCE PROCEEDINGS

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The proceedings will be published by IEEE Computer Society

Conference Publishing Services (CPS). Accepted papers will

also be submitted for inclusion into the IEEE Xplore and

to other abstracting and indexing partners such as

the Ei Compendex.

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The conference consists of many components including

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(1) Research Track (regular and short papers)

(2) Industry Track

(3) Fast Abstract Track

(4) Poster Sessions

(5) IEEE Contest on Software Testing

(6) Tutorials

(7) Workshops

(8) Keynote Speeches

(9) Panels

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ORGANIZING COMMITTEE

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Honorary General Chair

Huimin Lin, Chinese Academy of Sciences, China

General Chairs:

Shaoying Liu, Hosei University, Japan

Vytautas Bučinskas, Vilnius Gediminas Technical University, Lithuania

Program Chairs:

Mei Nagappan, University of Waterloo, Canada

Christof Budnik, Siemens Corporate Technology, USA

W.K. Chan, City University of Hong Kong, China

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GENERAL INQUIRIES

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For more details and updated information, please refer to

http://qrs.techconf.org, or send emails to qrsconference@outlook.com