ITC 2020 : IEEE International Test Conference

  in Conferences   Posted on June 5, 2020

Conference Information

Submission Deadline Friday 29 May 2020 Proceedings indexed by :
Conference Dates Nov 3, 2020 - Nov 5, 2020
Conference Address Washington, United States
Conference & Submission Link
Conference Organizers : ( Deadline extended ? Click here to edit )

Conference Ranking & Metrics (This is a TOP Conference)

G2R Score 2.64
#Contributing Top Scientists 17
#Papers published by Top Scientists 23
Google Scholar H5-index 5
Guide2Research Overall Ranking: 327
Category Rankings
Machine Learning & Artificial Intelligence 85

Conference Call for Papers

Topicsof interest include (but not limited to): 3D/2.5D TestAdaptive Test in PracticeArtificial Intelligence (AI)/Machine Learning in TestATE/Probe Card DesignAutomotive TestAdvances in Boundary ScanBring-UpData Driven MethodsData Exchange and InfrastructureDefect-oriented TestingDFM and TestDiagnosisEconomics of TestEnd-to-End Data AnalysisEnd-to-End System SecurityEmbedded BIST andDFTEmerging Defect MechanismsField Monitoring, Test, & DebugHardware Security and TrustIoT TestingJitter, High-Speed I/O and RF TestKnown-Good-DietestingMemory Testand RepairMEMS TestingMixed-Signal and Analog TestNew Technologiesand TestOn-Chip Test CompressionOnline TestPre-Silicon VerificationPost-Silicon ValidationPower Issues in TestProtocol-aware TestQuantum Device TestingReliability and ResilienceScan Based TestSoC/SiP/NoCTestSilicon DebugSimulation and EmulationSystem Test (Applications)System Test (Hardware/Software)Test-to-Design FeedbackTest Escape AnalysisTest Flow OptimizationsTest Generationand ValidationTest Resource PartitioningTest StandardsTest Time Analysis and ReductionTesting High Speed Optics/PhotonicsTiming TestYield Analysis and Optimization

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