IOLTS 2020 : IEEE International On-Line Testing Symposium

  in Conferences   Posted on June 4, 2020

Conference Information

Submission Deadline Wednesday 18 Mar 2020 Proceedings indexed by :
Conference Dates Jul 13, 2020 - Jul 15, 2020
Conference Address Virtual Event, Online
Conference & Submission Link
Conference Organizers : ( Deadline extended ? Click here to edit )

Conference Ranking & Metrics (This is a TOP Conference)

Guide2Research Overall Ranking: 397
Category Rankings
Software Engineering & Programming 129
Hardware, Robotics & Electronics 53
Number of Editions: 26

Google Scholar H5-index:

Conference Call for Papers

ssues related to On-line testing techniques, and more generally to design for robustness, are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective design for robustness techniques. These needs have increased dramatically with the introduction of nanometer technologies, which impact adversely noise margins; process, voltage and temperature variations; aging and wear-out; soft error and EMI sensitivity; power density and heating; and make mandatory the use of design for robustness techniques for extending, yield, reliability, and lifetime of modern SoCs. Design for reliability becomes also mandatory for reducing power dissipation, as voltage reduction, often used to reduce power, strongly affects reliability by reducing noise margins and thus the sensitivity to soft-errors and EMI, and by increasing circuit delays and thus the severity of timing faults. There is also a strong relation between Design for Reliability and Design for Security, as security attacks are often fault-based.

The International Symposium on On-Line Testing and Robust System Design (IOLTS) is an established forum for presenting novel ideas and experimental data on these areas. The Symposium is sponsored by the IEEE Council on Electronic Design Automation (CEDA) and the 2020 edition is organized by the IEEE Computer Society Test Technology Technical Council, the Politecnico di Torino, the University of Athens, the TIMA Laboratory, and iRoC Technologies.

The topics of interest include (but are not limited to) the following ones:

Dependable system design
Dependable Computer Architectures
Design for Reliability approaches for Low-Power
Cross-layer reliability approaches
Fault-Tolerant and Fail-Safe systems
Functional safety
Self-Test and Self-Repair
Self-Healing design
Self-Regulating design
Self-Adapting design
Reliability issues of Low-Power Design
Robustness evaluation
Quality, yield, reliability and lifespan issues in nanometer technologies
Variability, Aging, EMI, and Radiation Effects in nanometer technologies
On-line testing techniques for digital, analog and mixed-signal circuits
Self-checking circuits and coding theory
On-line monitoring of current, temperature, process variations, and aging
Power density and overheating issues in nanometer technologies
Field Diagnosis, Maintainability, and Reconfiguration
Design for Security
Fault-based attacks and counter measures
Design for Robustness for automotive, railway, avionics, space, large industrial applications, IT infrastructure, cloud computing, and wired, cellular and satellite communications
CAD for robust circuits design

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