IOLTS 2019 : 25th IEEE International Symposium on On-Line Testing and Robust System Design

  in Conferences   Posted on February 3, 2019

Conference Information

Submission Deadline Tuesday 12 Feb 2019
Conference & Submission Link http://tima.univ-grenoble-alpes.fr/conferences/iolts/iolts19/
Conference Dates Jun 1, 2019 - Jun 3, 2019
Conference Address Rhodes Island, Greece
Proceedings indexed by
Conference Organizers : ( Deadline extended ? Click here to edit )

Conference Call for Papers

Issues related to On-line testing techniques, and more generally to design for robustness, are increasingly important in modern electronic systems. In particular,

the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is

a corresponding increasing demand for cost-effective design for robustness techniques. These needs have increased dramatically with the introduction of

nanometer technologies, which impact adversely noise margins; process, voltage and temperature variations; aging and wear-out; soft error and EMI sensitivity;

power density and heating; and make mandatory the use of design for robustness techniques for extending, yield, reliability, and lifetime of modern SoCs. Design

for reliability becomes also mandatory for reducing power dissipation, as voltage reduction, often used to reduce power, strongly affects reliability by reducing

noise margins and thus the sensitivity to soft-errors and EMI, and by increasing circuit delays and thus the severity of timing faults. There is also a strong relation

between Design for Reliability and Design for Security, as security attacks are often fault-based.

The International Symposium on On-Line Testing and Robust System Design (IOLTS) is an established forum for presenting novel ideas and experimental data

on these areas. The Symposium is sponsored by the IEEE Council on Electronic Design Automation (CEDA) and the 2019 edition is organized by the IEEE

Computer Society Test Technology Technical Council, the University of Athens, and the TIMA Laboratory.

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