IOLTS 2018 : IEEE International On-Line Testing Symposium

  in Conferences   Posted on September 24, 2017

Conference Information

Submission Deadline Wednesday 14 Feb 2018
Conference & Submission Link http://tima.univ-grenoble-alpes.fr/conferences/iolts/iolts18/
Conference Dates Jul 2, 2018 - Jul 4, 2018
Conference Address Platja d’Aro, Spain
Proceedings indexed by
Conference Organizers : ( Deadline extended ? Click here to edit )

Conference Ranking & Metrics (This is a TOP Conference)

Google Scholar H5-index: 13
CORE 2017 Rating: C
Guide2Research Overall Ranking: 372
Category Rankings
Software Engineering & Programming 108
Hardware, Robotics & Electronics 53

Conference Call for Papers

Issues related to On-line testing techniques, and more generally to design for robustness, are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective design for robustness techniques. These needs have increased dramatically with the introduction of nanometer technologies, which impact adversely noise margins; process, voltage and temperature variations; aging and wear-out; soft error and EMI sensitivity; power density and heating; and make mandatory the use of design for robustness techniques for extending, yield, reliability, and lifetime of modern SoCs. Design for reliability becomes also mandatory for reducing power dissipation, as voltage reduction, often used to reduce power, strongly affects reliability by reducing noise margins and thus the sensitivity to soft-errors and EMI, and by increasing circuit delays and thus the severity of timing faults. There is also a strong relation between Design for Reliability and Design for Security, as security attacks are often fault-based.

Quality, yield, reliability and lifespan issues in nanometer technologies
Variability, Aging, EMI, and Radiation Effects in nanometer technologies
Self-Test and Self-Repair
Design-for-Reliability
On-line testing techniques for digital, analog and mixed-signal circuits
Self-checking circuits and coding theory
On-line monitoring of current, temperature, process variations, and aging
Self-Healing design
Self-Regulating design
Self-Adapting design
Cross-layer reliability approaches
Reliability issues of Low-Power Design
Design for Reliability approaches for Low-Power
Power density and overheating issues in nanometer technologies
Fault-Tolerant and Fail-Safe systems
Dependable system design
Field Diagnosis, Maintainability, and Reconfiguration
Design for Security
Fault-based attacks and counter measures
Design for Robustness for automotive, railway, avionics, space, large
industrial applications, IT infrastructure, cloud computing, and wired,
cellular and satellite communications
Robustness evaluation
CAD for robust circuits design

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